IAR Systems offer a range of in-circuit debugging probes, covering different needs from initial to more advanced development. The probes are completely integrated with IAR Embedded Workbench, and targeted for simplified, seamless and more flexible development workflows.
I-jet features automatic core recognition, and direct download into the flash memory of most popular microcontrollers. It has the capability of measuring target power consumption with a high degree of accuracy, and can supply the target boards with power, entirely powered by USB. I-jet is available for microcontrollers based on any ARM core. I-scope adds current and voltage measurements capabilities to I-jet.
JTAGjet-Trace offers advanced trace functionality for ARM and ARM Cortex-based applications. It can perform trace acquisition of up to 400 MSamples/sec and it has a capture capacity of 18MB in the trace buffer. In addition, it features a Smart Flash Programmer, JTAG chain device detection, and variable and adaptive JTAG clock.
All products are delivered with access to technical support and product maintenance.