Safety-certified tools Tools for Automotive Applications C-STAT Static analysis C-RUN Runtime analysis Debugging and trace probes IAR Visual State
New integration with JTAGjet™-Trace adds advanced trace functionality
Uppsala, Sweden—November 12, 2012—IAR Systems® today launched a complete integration of JTAGjet™-Trace into the development tool suite IAR Embedded Workbench® for ARM®. Thanks to the new full integration, IAR Embedded Workbench users gain access to advanced trace support for all ARM cores and can take full advantage of the trace capabilities on ARM Cortex™-M, Cortex-R and Cortex-A devices in addition to ARM7/9/11 when debugging complex systems.
JTAGjet-Trace is an in-circuit debugging probe with advanced trace features for complex application development. With support for Embedded Trace Macrocell (ETM), it provides developers with complete insight into their application’s behavior. Users can observe the effect of the program as it executes on the board and use techniques such as full instruction trace and function profiling to identify problems in the application. JTAGjet-Trace is based on the JTAG boundary scan port and can perform trace acquisition of up to 200MHz trace clock (400Msample/sec ETM trace acquisition speed) with a trace buffer capture capacity of up to 18MB. Auto-adjusting timing eliminates problems with data and clock skew, and 56-bit time stamping provides CPU cycle accuracy down to 5ns.
IAR Embedded Workbench now also supports the possibility of simultaneously connecting multiple serial wire debug (SWD) devices. This considerably simplifies debugging of ARM Cortex multicore devices. By connecting to multiple cores on the same device at the same time, the complete multicore application can be concurrently debugged.
“The demand for extended debugging and trace possibilities is high,” confirmed Mats Ullström, Director of Products and Services, IAR Systems. “With the integration of JTAGjet-Trace, we offer expanded trace functionality, and continue to supply our existing and new customers with high-quality, well-integrated tools. By combining the advanced debugging functionality in IAR Embedded Workbench with JTAGjet-Trace, users gain new possibilities for powerful debugging with trace.”
IAR Embedded Workbench is a complete C/C++ development tool suite for embedded applications, including high-performing build tools and the comprehensive IAR C-SPY® Debugger. Recognizing the importance of providing simplified, seamless development workflows, IAR Systems purchased Signum Systems in 2011 and now offers a product portfolio of completely integrated in-circuit debugging probes. In addition to JTAGjet-Trace, the portfolio includes I-jet™, which offers full power profiling for all ARM cores. All products are delivered with access to IAR Systems’ extensive technical support.
JTAGjet-Trace is available in a specific ARM Cortex-M edition, as well as a full edition with support for all ARM7, ARM9, ARM11, Cortex-M, Cortex-A8/A9 and Cortex-R4 cores equipped with ETM trace logic.
Development tools from IAR Systems
For more information about IAR Systems in-circuit debugging probes, visit www.iar.com/probes.
To download evaluation licenses of IAR Embedded Workbench for ARM, visit www.iar.com/ewarm.
Editor's Note: IAR Systems, IAR Embedded Workbench, C-SPY, visualSTATE, The Code to Success, IAR KickStart Kit, I-jet, IAR and the logotype of IAR Systems are trademarks or registered trademarks owned by IAR Systems AB. All other products are trademarks of their respective owners.
About IAR Systems
IAR Systems is the world’s leading supplier of software tools for developing embedded systems applications. The software enables over 14,000 large and small companies to develop premium products based on 8-, 16-, and 32-bit microcontrollers, mainly in the areas of industrial automation, medical devices, consumer electronics, telecommunication and automotive products. IAR Systems has an extensive network of partners and cooperates with the world’s leading semiconductor vendors. IAR Systems Group AB is listed on NASDAQ OMX Stockholm. For more information, please visit www.iar.com
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