Integrated tools simplify your development workflow. Our feature-rich in-circuit debugging probes enable powerful features in IAR Embedded Workbench.
I-jet provides a fast debugging platform via JTAG and SWD/SWO. It can measure target power consumption with a high degree of accuracy and enables Power debugging in IAR Embedded Workbench. I-jet supports all ARM and ARM-Cortex cores.
I-jet Trace provides extensive debugging and trace functionality. It delivers large trace memory capacities and high-speed communication via SuperSpeed USB 3.0. I-jet Trace is equipped with Embedded Trace Macrocell (ETM) trace, supporting all Cortex-M devices with ETM.
I-scope adds current and voltage measurement capabilities to I-jet and I-jet Trace. The measurements can be done at any designated points on the target board and are displayed in real-time by the C-SPY Debugger in IAR Embedded Workbench.
I-scope measures current and voltages and sends it to I-jet, which synchronizes the data with the program counter of the running application. The data can be graphed and profiled in real time and analyzed using C-SPY. The current sensing is done by connecting two differential current measurement leads across a shunt resistor on the target board.
Use the power analysis to:
Please note: I-scope is used in combination with I-jet or I-jet Trace.