Debugging and trace probes

Debugging and trace probes

Integrated tools simplify your development workflow. Our feature-rich in-circuit debugging probes enable powerful features in IAR Embedded Workbench.

I-jet

I-jet provides a fast debugging platform via JTAG and SWD/SWO. It can measure target power consumption with a high degree of accuracy and enables Power debugging in IAR Embedded Workbench. I-jet supports all ARM and ARM-Cortex cores.

  • Supports ARM7/ARM9/ARM11 and Cortex-M/R/A cores
  • Hi-speed USB 2.0 interface (480Mbps)
  • No power supply required, powered entirely by the USB port
  • Target power of up to 400mA can be supplied from I-jet with overload protection
  • Target power consumption can be measured with ~200µA resolution at 200kHz
  • JTAG and Serial Wire Debug (SWD) clocks up to 32MHz (no limit on the MCU clock speed)
  • Serial Wire Viewer (SWV) with UART and Manchester encoding
  • Support for SWO speeds of up to 60MHz
  • Download speed of up to 1MByte/sec
  • Automatic core recognition
  • Support for multiple JTAG devices with automatic chain detection and graphical display
  • Support for JTAG adaptive clocking (RTCK)
  • Automatic JTAG/SWD detection
  • JTAG voltage measurement and monitoring
  • Supports target voltage range from 1.65V to 5V
  • Support for Micro Trace Buffer (MTB) for ARM Cortex-M0+

I-jet Trace 

I-jet Trace provides extensive debugging and trace functionality. It delivers large trace memory capacities and high-speed communication via SuperSpeed USB 3.0. I-jet Trace is equipped with Embedded Trace Macrocell (ETM) trace, supporting all Cortex-M devices with ETM.

  • Supports ARM Cortex-M cores
  • SuperSpeed USB 3.0 interface (5 Gbps)
  • Fully compatible with USB 2.0 (480 Mbps)
  • No power supply required, powered entirely by the USB port
  • Target power of up to 400mA can be supplied from I-jet Trace with overload protection
  • Automatic core recognition

Debugging features

  • JTAG and SWD clocks up to 100 MHz
  • Support for SWO using Manchester and UART, at up to 200 Mbps
  • Support for multiple JTAG devices with automatic chain detection and graphical display
  • Support for JTAG adaptive clocking (RTCK)
  • Automatic JTAG/SWD detection
  • JTAG voltage measurement and monitoring
  • Target power consumption can be measured with ~160µA resolution at up to 200 ksps (kilo samples per second)
  • Support for Micro Trace Buffer (MTB) for ARM Cortex-M0+

Trace features

  • Up to 150MHz ETM trace clock
  • Memory capacity of 32 Msamples
  • 64-bit time stamp with CPU cycle accuracy for timing analysis

I-scope

I-scope adds current and voltage measurement capabilities to I-jet and I-jet Trace. The measurements can be done at any designated points on the target board and are displayed in real-time by the C-SPY Debugger in IAR Embedded Workbench.

I-scope measures current and voltages and sends it to I-jet, which synchronizes the data with the program counter of the running application. The data can be graphed and profiled in real time and analyzed using C-SPY. The current sensing is done by connecting two differential current measurement leads across a shunt resistor on the target board.

Use the power analysis to:

  • Reveal the power consumption of individual functions and peripherals
  • Identify I/O activities that cause current spikes
  • Diagnose low power mode
  • Investigate MCU frequency and core voltage power savings
  • Find conflicting hardware setup
  • Reduce RF emissions by identifying and eliminating unwanted current spikes
  • Measure and compare battery consumption in various MCU sleep modes

Specifications

  • I+ and I- differential voltage, 110mV full scale across shunt resistor
  • One differential current channel, 0-6V common mode
  • Three voltage channels, 0-6V
  • Sampling rate up to 200 kHz with 12 bit resolution
  • Includes one MIPI-20 flat cable for attaching to the I-jet
  • Includes 6 flying test leads and 6 grabbers
  • Supports all ARM cores

Please note: I-scope is used in combination with I-jet or I-jet Trace.

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