I-scope

Enabling current and voltage measurement capabilities with I-jet.

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Flexible current & voltage measurement

I-scope adds current and voltage measurement capabilities to I-jet and I-jet Trace probes. The measurements can be done at any designated points on the target board and are displayed in real-time by the C-SPY Debugger in IAR Embedded Workbench for Arm.

Power consumption of individual functions

I-scope measures current and voltages and sends it to I-jet probe family, which synchronizes the data with the program counter of the running application. The data is graphed and profiled using C-SPY.

Real time measurement

I-scope provides the power data of the running the application in real time so you can view the power profile and optimize your code for better power efficiency.

High resolution

I-scope can measure the consumption with a sampling rate up to 200 kHz with 12 bit resolution. The current sensing is done by connecting two differential current measurement leads across a shunt resistor on the target board.

Details of using I-scope

Use the power analysis to:

Reveal the power consumption of individual functions and peripherals
Identify I/O activities that cause current spikes
Diagnose low power mode
Investigate MCU frequency and core voltage power savings
Find conflicting hardware setup
Reduce RF emissions by identifying and eliminating unwanted current spikes
Measure and compare battery consumption in various MCU sleep modes

Specifications

I+ and I- differential voltage, 110mV full scale across shunt resistor
One differential current channel, 0-6V common mode
Three voltage channels, 0-6V
Sampling rate up to 200 kHz with 12 bit resolution
Includes one MIPI-20 flat cable for attaching to the I-jet
Includes 6 flying test leads and 6 grabbers
Supports all Arm Cortex-M cores with SWO (Serial Wire Output)

Please note: I-scope is used in combination with I-jet or I-jet Trace.

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Additional information

CE and RoHS compliance

Our debug probes I-jet, I-jet Trace and I-scope are in compliance with:

CE: EMC Directive 2014/30/EU on the following test standards for IT product:
EN 55022:2010/AC:2011, EN 61000-3-2:2014 & EN 61000-3-3:2013
EN 55024: 201++A1:2015

CE: RoHS 3 Directive (EU) 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the restriction of the use of certain hazardous substances in electrical and electronic equipment, including all applicable amendments—Directive (EU) 2015/863

FCC: the requirements of 47 CFR Part 15 regulation & ANSI C63.4 for the evaluation of Class A of electromagnetic compatibility.

Regulation (EC) No 1907/2006 of the European Parliament and of the Council of 18 December 2006 concerning the Registration, Evaluation, Authorization and Restriction of Chemicals (REACH).

Regulation (EC) No 850/2004, (EU) No 519/2012 of the European Parliament and of the Council on Persistent Organic Pollutants (POPs )

US provision to the Wall Street Reform and Consumer Protection Act (ref: Dodd-Frank Act 1502 on conflict minerals)

SJ/T 11363-2006 for Management Methods for Controlling Pollution by Electronic Information Products (China RoHS)

Directive 2012/19/EU of the European Parliament and of the Council of 4 July 2012 on Waste Electrical & Electronic Equipment (WEEE)

We keep working together with our partners and suppliers to fulfill our responsibility to ensure our are products in compliance with the above directives, regulations and requirements.

Connectors and adapters

I-jet and I-jet Trace has a MIPI-20 connector on the front panel and come with MIPI-20 and MIPI-10 cables, as well as a legacy ARM-20 adapter. For I-jet Trace, only the MIPI-20 cable supports the ETM trace functionality, MIPI-10 and ARM-20 are for plain JTAG/SWD/SWO debugging. For details on the connectors, see the user manual.

In addition, the following adapters are available from IAR Systems to fit different target connectors:

ADA-MIPI20-TI14 Adapter
ADA-MIPI20-CTI20 Adapter
ADA-MIPI20-ISO Adapter
ADA-MIPI20-STSWD6 Adapter