IAR Systems launches Embedded on Tour in Finland and Sweden

Bringing trends and topics to the Nordics from Embedded World, the biggest annual event in the industry

Uppsala, Sweden—February 18, 2013—For embedded software designers in Finland and Sweden who would like to gain in-depth understanding of the current discussions in the embedded community, IAR Systems® offers a half-day series of technical sessions to recapitulate news and presentations from Embedded World. The seminars take place on March 12, at Radisson Blu Seaside Hotel in Helsinki, Finland and on March 14 at Kista Entré in Stockholm, Sweden. The seminars are free of charge, but early registration is recommended as space is limited. The registration is open at www.iar.com/ontour.

“Embedded World is the biggest and most influential annual event in the world for our industry, but we realize of course that everyone cannot attend it. Since both Finland and Sweden have many leading-edge companies in the embedded sector and IAR Systems has an outstanding position in the industry, we want to share our impressions and sessions during Embedded World 2013 with the embedded community in the Nordics,” says Stefan Skarin, CEO of IAR Systems.

From 13:00 until 17:00, IAR Systems’ technical expert team will share the embedded trends and topics in focus for 2013 and also discuss power debugging and trace, as well as coding practices for embedded systems with high requirements on functional safety:

Session 1: “Trends & Topics 2013”
This session provides a summary of the trends and topics picked up in discussions with industry representatives at Embedded World 2013. What are the main focus areas for embedded systems in 2013?

Session 2: “Visualizing MCU power consumption in a debug environment”
In this session, we will discuss the underlying technical challenges to get reliable power measurements in a debugging environment where the physical constraints include frequency response, noise and synchronization with the executed code. The methods available range from shunt resistor circuits to true energy metering. How good can such systems visualize power consumption and what are the typical use cases?

Session 3: “Taking trace to the next level”
A modern JTAG debug probe can facilitate surprisingly advanced visualizations of the application behavior using the simple instrumentation trace (ITM) available in all Cortex-M3/M4 devices. Utilizing the full instruction trace (ETM) available in many ARM® devices adds even more possibilities. Combined they enable correlated visualization of call stack, interrupt log, and data log values plotted against a common time axis. In this session we will look at the technology behind trace and use trace-based debugger technology to demonstrate the benefits of ARM Cortex™ debug features.

Session 4: “Keeping safe at C”
This session will take a look at how some of the inherent dangers of C can be neutralized by adopting a coding standard and accompanying coding guidelines. We will draw inspiration from the MISRA 2004 rule set and from the requirements and recommendations of various safety standards derived from IEC61508 and show numerous examples of what can go wrong. A nice side effect of avoiding the murkiest corners of the language is that the build chain has a better chance of producing optimal code.

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