IAR Systems provides development tools for Microsemi’s SmartFusion2 SoC FPGAs

Uppsala, Sweden—March 18, 2013—Today, IAR Systems® announces support for the newly released SmartFusion®2 product family from Microsemi Corporation. Customers working with these logic devices now gain access to the powerful code optimizations and comprehensive debugging and trace capabilities offered by the C/C++ development tool suite IAR Embedded Workbench® for ARM®.

Microsemi’s SmartFusion2 system-on-chip (SoC) field-programmable gate arrays (FPGAs) are designed to address the reliability requirements of high availability, safety-critical and mission-critical systems in industrial, aviation, defense and communications applications. SmartFusion2 integrates inherently reliable flash-based FPGA fabric, a 166 megahertz (MHz) ARM Cortex™-M3 processor, advanced security processing accelerators, DSP blocks, SRAM, eNVM and industry-required high-performance communication interfaces all on a single chip.

“We are excited that our customers can benefit from using the high-performance compiler and debugger tools provided by IAR Systems,” says Jim Davis, vice president of software & systems engineering at Microsemi. “In addition to advanced security capabilities, our SmartFusion2 Soc FPGA devices also feature low power consumption without sacrificing performance. Microsemi’s Libero® SoC software toolset for SmartFusion2 fully integrates IAR Embedded Workbench for application development, providing a powerful and user-friendly full set of tools.”

“We have been fortunate to work with Microsemi for many years, and support for SmartFusion2 strengthens our position in the FPGA domain,” says Mats Ullström, Director of Products and Services, IAR Systems. “By using IAR Systems’ tools for compiling and debugging, developers working with SmartFusion2 will be able to fully leverage Microsemi’s advanced technology.”

IAR Embedded Workbench integrates the highly optimizing IAR C/C++ Compiler™, as well as the feature-rich C-SPY® Debugger. IAR Systems’ integrated in-circuit debugging probe JTAGjet™-Trace enables complete insight into the application’s behavior through Embedded Trace Macrocell (ETM). Users can observe the effect of the program as it executes on the board and use features like full instruction trace and function profiling to identify problems in the application. More information and free evaluation licenses are available at www.iar.com/ewarm.

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